As electronic systems become more complex, so do the chips that go into these systems. Higher chip complexity results in more complex and expensive manufacturing testing of these chips. Unfortunately, chip test cost is rising faster than the revenues the chips generate in other words, SOC Test cost is becoming a larger percentage of total chip cost. This article will review the reasons for the rapid rise in chip test cost and what can be done, both from the design and ATE (automatic test equipment) sides, to slow down the runaway cost of testing.